connect:ID 2017

01/05/17

Conference: 1-3 May, 2017
Free Exhibition: 2-3 May, 2017
Washington DC

connect:ID is an innovative conference and exhibition event focusing on identity technologies and the opportunities for their management in both the physical and digital worlds. 

Reasons to attend connect:ID 2017:

  • Three conference HUBs – biometricID:HUB; mobileID:HUB; and secureID:HUB. Follow one HUB or mix and match tracks.
     
  • In-depth, non-commercial presentations, case studies and discussions by carefully selected expert speakers.
     
  • Conference discounts for early bookers, government and selected end users.
     
  • 75+ industry leaders exhibiting an impressive array of identity technology, services and solutions.
     
  • The extensive exhibition is free to visit.
     
  • Network with 1000+ international attendees from governments, industry, NGOs, and professional service providers.

connect:ID 2017 will be held May 1-3, 2017 at the prestigious Walter E Washington Convention Centre, Washington DC.

This event is brought to you by Science Media Partners and the International Biometrics + Identity Association (IBIA) and unites solutions adopters and stakeholders from around the world to explore the development and fusion of multiple advanced identity technologies – including biometrics, secure credentials and mobile identity systems.

Find out more at www.connectidexpo.com

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