connect:ID 2018

30/04/18

30 April - 2 May
Washington, DC

Global exhibition • Cutting-edge conference • Countless opportunities

connect:ID is an innovative international conference and a free global exhibition that together focus on all aspects of identity technologies and the opportunities for their management in both the physical and digital worlds.

connect:ID Conference - April 30 - May 2, 2018
Hear from some of the key players in the identity technology marketplace from thought leaders to end users with three days of cutting-edge revelations, future insights, case histories and panel discussions.

connect:ID Exhibition - May 1 - 2, 2018
Explore the latest developments and releases in identity technology solutions with 100 exhibitors all under one roof. Entrance to the exhibition is free and includes access to a series of free seminars in The Knowledge Exchange.

Find out more at: www.connectidexpo.com

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Latest Features & Interviews

Interview: Sean Farrell, Head of Portfolio Management, Government Solutions, SITA

Planet Biometrics discussed the future of biometric travel technology with Sean Farrell, head of Portfolio Management, Government Solutions, SITA.

Interview: Get Group's Gerald Hubbard

Ahead of connect:ID 2017, Security Document World took time-out to speak to Gerald Hubbard, director of business development  at Get Group

White paper: Slovakia prototypes mobile electronic identification (MeID) solution

Empowering e-government by shifting to smart cards is accelerating the arrival of a new era of mobile identity and electronic documents.

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